Self-Checking Decoder Using Hardware Redundancy
Keywords:
Binary decoder, concurrent error detection, self checking, hard ware redundancyAbstract
A binary decoder is a combinational circuit that converts binary information from n input lines to maximum of 2n unique output lines. But there is no guaranty that the decoder always produce the correct output due to some types of faults. The characteristics of these types of faults render them undetectable by standard test strategies. The detection of intermittent faults requires the use of Concurrent Error Detection technique, which continuously monitors the operation of circuits and compares them with some known reference. Concurrent Error Detection is an important technique in the design of system in which dependability and data integrity are important. This can be achieved by incorporating some form of redundancy into the system. One method of implementing Concurrent Error Detection in Very Large Scale Integrated circuit is through the use of hardware redundancy. This paper investigates the use of hardware redundancy into unchecked system as a mean of incorporating Concurrent Error Detection into a self- checking binary decoder.
References
[1] Maamar, M., and Russell, G., “ A 32-bit RISC processor with concurrent error detection., Proc. 24th Euromicro Conference, August 1998, Sweden, PP. 461-467.
[2] M. Morris Mano and Charles R. Kime "Logic and Computer Design Fundamentals" by Prentice Hall, 3rd edition, chapter 7.p331.
[3] M.MORRIS MANO, “Digital Design”, 2002, 1991, 1984 by Prentice Hall, Upper Saddle River, New Jersey 07458, Chapter 6, P234.
[4] Dhiraj K. Pradhan, “Fault Tolerant Computer System Design”, Prentice Hall PTR, Upper Saddle River, New Jersey 07458, 1995, PP.1-22.
[5] Russell, G.; Maamar, A.H., "Check bit prediction scheme using Dong's code for concurrent error detection in VLSI processors," Computers and Digital Techniques, IEE Proceedings - , vol.147, no.6, pp.467-471, Nov 2000.
[6] M. A Marouf, A. D. friedman, “Design of self-checking checker using Berger code”, Proc. Int. Symp. Fault tolerant computing, 1978, PP. 179-194.
[7] Miron Abramovici, Melvin A.Breuer, and Arthur D.Friedman, "Digital Systems Testing and Testable Design”,1990,ISBN 0-7803- 1062-4, Chapter 13:SELF-CHECKING DESIGN, pp.569-587.
[8] Huda Abugharsa, and Ali Maamar," Self Checking Systolic LIFO Stack",7th WSEAS Int. Conf. on Instrumentation, Measurement, Circuits and Systems (IMCAS '08), Hangzhou, China, April 6-8,2008.
[9] Amal J. Mahfoud, Khadija F. Algheitta, Ali H. Maamar, “Design of a self-checking down counter”, Libyan International Conference on Electrical Engineering and Technologies, Tripoli- Libya, 4-6 2018.
Downloads
Published
Issue
Section
License
Copyright (c) 2020 Journal of Electrical and Electronic Engineering and Information Technology

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
